Highlights:

 ☆ The Teseda DI Lab SystemTM (Defect Isolation), designed from direct user experiences, includes the complete suite of Teseda tools to address the critical needs in device analyses
 ☆ Perform continuity, DC parametric testing and curve trace to analyze device current-voltage characteristics
 ☆ Automatically detect broken scan chains down to the specific defective scan cell index
 ☆ Run the same production tests to understand the logical behavior of failing devices that an ATE cannot provide
 ☆ Map failing scan cells against the physical design to localize defects
 ☆ Diagnose root cause in one single physical environmen


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