Highlights:

 ☆ Small, compact and mobile scan-based system focused on silicon debug, test development, and Failure Analysis
 ☆ Quickly perform the same tests run in production, but with access to the detailed failing data for precise device analysis
 ☆ Test patterns, hardware configuration setups and test results are all saved and archived in a single environment
 ☆ Multipurpose platform to run tests on the device for pre- and post-production test, at the factory or in the field
 ☆ Capture test results in pass/fail, failure capture and full capture modes of operation and display the test results graphically
 ☆ Built-in DC parametric measurement tests with access to any pin by external instrumentation
 ☆ Stimulate the device in Failure Analysis with vector looping and pause capabilities for emission or to further analyze the behavior of defect


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