Highlights:

 ☆ Portable lightweight diagnostic system for screening failed devices in remote field locations
 ☆ Designed for remote customer quality engineers working with end-users
 ☆ Provides rapid screening of potential RMAs and reduced volume of field returns
 ☆ Fast and easy curve tracing of semiconductor devices with comparison to Golden Device
 ☆ Data is stored and displayed graphically for each individual DUT pin
 ☆ Automatic report generation for rapid and clear communication internally and with end customers


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