As vehicles become increasingly software-defined and electronics-driven, the cost of
semiconductor failure has never been higher. Automotive recalls tied to electronic failures
continue to rise, exposing gaps between standards compliance and real-world field
performance.


Join Rambus and Tartan Silicon Systems for a technical webinar examining why reliability
and supply chain security must be addressed together to meaningfully reduce recall risk
across the automotive semiconductor lifecycle.


Webinar Title: Reliability and Supply Chain Security for the Automotive Semiconductor
Industry


Date & Time: Thursday, May 21, 2026 at 11:00am PT | 2:00pm ET    


                                                


In this session, we will: 

      •  Review real-world automotive recalls caused by electronic failures
      •  Discuss why ISO 26262 and AEC-Q100 are no longer sufficient on their own
      •  Explore evolving standards driving higher expectations for reliability and traceability
      •  Walk through the end-to-end chip lifecycle from wafer fabrication to in-vehicle
          operation
      •  Highlight how Rambus and Tartan deliver a combined approach to reliability
         monitoring and supply chain security 


You will also learn how hardware Root of Trust can be used as a unique wafer and die
fingerprint, enabling fab-to-field traceability and stronger supply chain trust. This webinar
is designed for automotive OEMs, Tier-1 suppliers, and semiconductor leaders looking to
build more resilient automotive electronics.


We hope to see you there! Register now to secure your spot.


Thanks!